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Pure Appl. Chem. Vol.
74, No. 9, pp. 1553-1570 (2002)
Pure and Applied Chemistry
Vol. 74, Issue 9
Morphology of nanostructured materials*
M. K. Sanyal, A. Datta, and S. Hazra**
Surface Physics Division, Saha Institute of Nuclear
Physics, 1/AF Bidhannagar, Kolkata 700064, India
Abstract: Here we shall discuss the importance of grazing incidence
X-ray scattering techniques in studying morphology of nanostructured
materials confined in thin films and multilayers. In these studies,
the shapes, sizes, and structures of nanostructured materials and their
distribution in composites are investigated. These studies are important
for understanding properties that may deviate considerably from the
known bulk properties. We shall first outline basics of three X-ray
scattering techniques, namely X-ray reflectivity, grazing incidence
small-angle X-ray scattering, and grazing incidence diffraction, used
for these studies. We shall then demonstrate the utility of these techniques
using some known results.
* Special Topic Issue on the Theme
of Nanostructured Advanced Materials
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